{"id":4170,"date":"2026-05-26T05:41:46","date_gmt":"2026-05-26T05:41:46","guid":{"rendered":"https:\/\/icstm2.ingesta.ro\/?post_type=lp_course&#038;p=4170"},"modified":"2026-06-09T19:14:35","modified_gmt":"2026-06-09T19:14:35","slug":"microscop-cu-forta-atomica-afm-ntegra-prima-by-nt-mdt","status":"publish","type":"lp_course","link":"https:\/\/icstm.valahia.ro\/en\/echipamente\/microscop-cu-forta-atomica-afm-ntegra-prima-by-nt-mdt\/","title":{"rendered":"ATOMIC FORCE MICROSCOPE (AFM) (Ntegra Prima by NT-MDT)"},"content":{"rendered":"<p>Dispozitivul este capabil s\u0103 efectueze aproximativ 40 de tipuri de m\u0103sur\u0103tori, ceea ce permite analiza propriet\u0103\u021bilor fizice ale suprafe\u021bei cu foarte bun\u0103 precizie la o rezolu\u021bie \u00eenalt\u0103. Este posibil\u0103 efectuarea de experimente \u00een aer, \u00een lichide \u0219i \u00een mediu controlat. Ntegra Prima opereaz\u0103 \u00een frecven\u021b\u0103 \u00eenalt\u0103 (p\u00e2n\u0103 la 5 MHz). Cu ajutorul <strong>AFM<\/strong>-ului se pot ob\u021bine imagini tridimensionale ale suprafe\u0163elor (izolatoare sau conductoare) cu o rezolu\u021bie nano \u00een plan lateral \u0219i sub \u00c5ngstrom \u00een plan vertical. Acest echipament este utilizat at\u00e2t \u00een cercetarea fundamental\u0103 c\u00e2t \u0219i la scal\u0103 mai mare. \u00cen industrie AFM-ul joac\u0103 un rol deosebit \u00een dezvoltarea nanotehnologiei, el reprezint\u0103 cea mai folosit\u0103 tehnic\u0103 a Microscopiei cu Scanare a Suprafe\u021bei (SPM). Exist\u0103 mai multe tipuri de scanare implementate \u00een modelul <strong>NTEGRA Prima<\/strong>: scanare pe prob\u0103, scanare de sond\u0103 \u0219i dubl\u0103-scanare. Sistemul este ideal pentru investigarea de suprafe\u021be mici cu dimensiuni de p\u00e2na la 100 x 100 x 10 \u00b5m. Ntegra Prima beneficiaz\u0103 de un\u00a0 sistem optic cu rezolu\u021bie de 1 \u00b5m ce permite urm\u0103rirea procesului de scanare \u00een timp real. Senzorii de control \u00een bucl\u0103 inchis\u0103, urm\u0103resc deplasarea real\u0103 a scanerului pe trei axe \u0219i compenseaz\u0103 imperfec\u021biunile inevitabile ale elementelor piezoceramice precum:\u00a0 non-liniaritatea, fluajul \u0219i histerezisul. Senzorii folosi\u021bi de NT-MDT, au cel mai sc\u0103zut nivel de zgomot, permi\u021b\u00e2nd astfel lucrul \u00een bucl\u0103 \u00eenchis\u0103 pe arii foarte mici (p\u00e2n\u0103 la 10&#215;10 nm).<\/p>\n<p><strong><em>Tehnici \u0219i moduri de m\u0103surare:<\/em><\/strong><\/p>\n<p><strong><em>\u00cen aer&amp;lichid:<\/em><\/strong><\/p>\n<ul>\n<li>AFM (contact + semi-contact + non-contact) \/ Microscopie cu for\u021b\u0103 lateral\u0103 (LFM) \/ Imagistic\u0103 de faz\u0103 (PIM) \/ Force Modulation\/ Microscopie cu for\u021b\u0103 de adeziune (AdFM) \/ Litografie AFM (Force)<\/li>\n<\/ul>\n<p><strong><em>Doar \u00een aer:<\/em><\/strong><\/p>\n<ul>\n<li>STM \/ Microscopie cu for\u021b\u0103 magnetic\u0103 (MFM) \/ Microscopie cu for\u021b\u0103 electrostatic\u0103 (EFM) \/ Microscopie cu scanare a capacit\u0103\u021bii (SCM) \/ Microscopie cu sond\u0103 Kelvin \/ Imagistic\u0103 a difuziei rezistivit\u0103\u021bii (SRI) \/ Litografie AFM.<\/li>\n<\/ul>\n<p><strong><em>\u00a0<\/em><\/strong><\/p>\n<p><strong><em>Aplica\u021bii:<\/em><\/strong><\/p>\n<ul>\n<li>biologie \u0219i biotehnologie;<\/li>\n<li>proteine, ADN, virusuri, bacterii, \u021besuturi;<\/li>\n<li>\u015ftiin\u021ba materialelor;<\/li>\n<li>morfologia suprafe\u021bei, propriet\u0103\u021bile piezoelectrice locale, for\u021be de adeziune, propriet\u0103\u021bi tribologice locale;<\/li>\n<li>materiale magnetice;<\/li>\n<li>observarea propriet\u0103\u021bilor magnetice;<\/li>\n<li>semiconductori (propriet\u0103\u021bi electrice);<\/li>\n<li>polimeri \u0219i filme sub\u021biri;<\/li>\n<li>dispozitive de stocare a datelor \u0219i a fi\u0219ierelor media;<\/li>\n<li>nanomateriale;<\/li>\n<li>nanostructuri;<\/li>\n<li>nanoelectronic\u0103.<\/li>\n<\/ul>","protected":false},"excerpt":{"rendered":"<p>Dispozitivul este capabil s\u0103 efectueze aproximativ 40 de tipuri de m\u0103sur\u0103tori, ceea ce permite analiza propriet\u0103\u021bilor fizice ale suprafe\u021bei cu [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":4171,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","course_category":[203],"course_tag":[],"class_list":["post-4170","lp_course","type-lp_course","status-publish","has-post-thumbnail","hentry","course_category-nanomateriale-si-nanotehnologii","course"],"_links":{"self":[{"href":"https:\/\/icstm.valahia.ro\/en\/wp-json\/wp\/v2\/lp_course\/4170","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/icstm.valahia.ro\/en\/wp-json\/wp\/v2\/lp_course"}],"about":[{"href":"https:\/\/icstm.valahia.ro\/en\/wp-json\/wp\/v2\/types\/lp_course"}],"author":[{"embeddable":true,"href":"https:\/\/icstm.valahia.ro\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/icstm.valahia.ro\/en\/wp-json\/wp\/v2\/comments?post=4170"}],"version-history":[{"count":1,"href":"https:\/\/icstm.valahia.ro\/en\/wp-json\/wp\/v2\/lp_course\/4170\/revisions"}],"predecessor-version":[{"id":4172,"href":"https:\/\/icstm.valahia.ro\/en\/wp-json\/wp\/v2\/lp_course\/4170\/revisions\/4172"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/icstm.valahia.ro\/en\/wp-json\/wp\/v2\/media\/4171"}],"wp:attachment":[{"href":"https:\/\/icstm.valahia.ro\/en\/wp-json\/wp\/v2\/media?parent=4170"}],"wp:term":[{"taxonomy":"course_category","embeddable":true,"href":"https:\/\/icstm.valahia.ro\/en\/wp-json\/wp\/v2\/course_category?post=4170"},{"taxonomy":"course_tag","embeddable":true,"href":"https:\/\/icstm.valahia.ro\/en\/wp-json\/wp\/v2\/course_tag?post=4170"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}