{"id":4185,"date":"2026-05-26T05:50:46","date_gmt":"2026-05-26T05:50:46","guid":{"rendered":"https:\/\/icstm2.ingesta.ro\/?post_type=lp_course&#038;p=4185"},"modified":"2026-06-09T19:11:45","modified_gmt":"2026-06-09T19:11:45","slug":"difractometru-de-raze-x-xrd","status":"publish","type":"lp_course","link":"https:\/\/icstm.valahia.ro\/en\/echipamente\/difractometru-de-raze-x-xrd\/","title":{"rendered":"DIFRACTOMETRU DE RAZE X (XRD)"},"content":{"rendered":"<p><strong><em>Technical features:<\/em><\/strong><\/p>\n<ul>\n<li>sistem de difrac\u021bie multimodular \u0219i multifunc\u021bional, de \u00eenalt\u0103 rezolu\u021bie, cu goniometru vertical q\/q (cu raza de 285 mm), \u00een geometrie G\/9;<\/li>\n<li>autoaliniere complet automat\u0103, prin control PC\u00a0;<\/li>\n<li>tub de raze X \u2013 anod de Cu (2 kW); detector &#8211; NaI cu limitare &gt;700.000 cps;<\/li>\n<li>func\u021bionare \u00een geometrie simetric\u0103 \u0219i asimetric\u0103 (cu posibilitate de modificare configura\u021bie optic\u0103): geometrie focusat\u0103 Bragg-Brentano de \u00eenalt\u0103 rezolu\u021bie; geometrie \u00een fascicul paralel (parallel beam) de \u00eenalt\u0103 rezolu\u021bie pentru reflectometrie de raze X (XRR) \u0219i, geometrie SAXS \u00een transmisie \u0219i reflexie; geometrie pentru difrac\u021bie pe arii mici (micro area);<\/li>\n<li>posibilitate de scanare pe axele: Ts (\u00een\u0103l\u021bimea tubului), Zs (\u00een\u0103l\u021bimea fantei), qD, qS;<\/li>\n<li>l\u0103\u021bimea pasului minim: pe axele de scanare Ts: 0.001mm, qD, qS:0.00010; pas minim de scanare pe axele qD\/qS \u00een modul cuplat 0.0002 \u0219i qD\/qS \u00een modul independent: 0.0001-6<sup>0<\/sup>.<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<p><strong><em>Aplica\u021bii: <\/em><\/strong><\/p>\n<ul>\n<li>identificare de faze, analiz\u0103 cantitativ\u0103, determinare structur\u0103 cristalografic\u0103, tip de re\u021bea, procent de cristalinitate, m\u0103rime de cristalit, determinare parametri de re\u021bea, rafinare Rietveld;<\/li>\n<\/ul>\n<ul>\n<li>determinare microstructuri &#8211; orientare preferen\u021bial\u0103 \u00een analize de textur\u0103, determinare tensiuni\/stress rezidual (sin 2y, bi-axial);<\/li>\n<li>aplica\u021biile pe filme (identificare de faz\u0103, orientare\/textur\u0103, strain\/stress, grosime\/ad\u00e2ncime profil pe film, rugozitate interfe\u021be, densitate);<\/li>\n<li>aplica\u021bii SAXS (structura macromolecular\u0103 \u0219i orientare materiale polimerice);<\/li>\n<li>distribu\u021bia m\u0103rimii nanoparticulelor \u00een suspensii;<\/li>\n<li>distribu\u021bie m\u0103rime particule la nanomateriale de tip \u201cbulk\u201d;<\/li>\n<li>morfologie molecular\u0103 \u0219i orientare \u00een nanocompozite;<\/li>\n<li>analiz\u0103 de reflectivitate raze X de \u00eenalt\u0103 rezolu\u021bie, mapare \u00een spa\u021biul reciproc tridimensional.<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<p><strong><em>Tip prob\u0103:<\/em><\/strong> Pulberi, nanopulberi, materiale solide, filme sub\u021biri.<\/p>\n<p><strong><em>Sectoare de activitate: <\/em><\/strong>mediu, nanotehnologie, industria alimentar\u0103, agricultur\u0103, cosmetice, metalurgie, industria chimic\u0103 \u0219i petrolier\u0103, produc\u021bia de polimeri, semiconductori, sisteme fotovoltaice, materiale, etc.<\/p>","protected":false},"excerpt":{"rendered":"<p>Caracteristici tehnice: sistem de difrac\u021bie multimodular \u0219i multifunc\u021bional, de \u00eenalt\u0103 rezolu\u021bie, cu goniometru vertical q\/q (cu raza de 285 mm), [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":4186,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","course_category":[204],"course_tag":[],"class_list":["post-4185","lp_course","type-lp_course","status-publish","has-post-thumbnail","hentry","course_category-caracterizarea-fizica-si-structurala-a-materiei","course"],"_links":{"self":[{"href":"https:\/\/icstm.valahia.ro\/en\/wp-json\/wp\/v2\/lp_course\/4185","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/icstm.valahia.ro\/en\/wp-json\/wp\/v2\/lp_course"}],"about":[{"href":"https:\/\/icstm.valahia.ro\/en\/wp-json\/wp\/v2\/types\/lp_course"}],"author":[{"embeddable":true,"href":"https:\/\/icstm.valahia.ro\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/icstm.valahia.ro\/en\/wp-json\/wp\/v2\/comments?post=4185"}],"version-history":[{"count":1,"href":"https:\/\/icstm.valahia.ro\/en\/wp-json\/wp\/v2\/lp_course\/4185\/revisions"}],"predecessor-version":[{"id":4187,"href":"https:\/\/icstm.valahia.ro\/en\/wp-json\/wp\/v2\/lp_course\/4185\/revisions\/4187"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/icstm.valahia.ro\/en\/wp-json\/wp\/v2\/media\/4186"}],"wp:attachment":[{"href":"https:\/\/icstm.valahia.ro\/en\/wp-json\/wp\/v2\/media?parent=4185"}],"wp:term":[{"taxonomy":"course_category","embeddable":true,"href":"https:\/\/icstm.valahia.ro\/en\/wp-json\/wp\/v2\/course_category?post=4185"},{"taxonomy":"course_tag","embeddable":true,"href":"https:\/\/icstm.valahia.ro\/en\/wp-json\/wp\/v2\/course_tag?post=4185"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}