ICSTM
Research Engineer S II
Echipamente
- Brevete Depuse
- Brevete Acordate
- GAS ANALYZER WITH THREE SENSORS KIGAZ 200 PRO
- PROFESSIONAL DIGITAL MIXED SIGNAL OSCILLOSCOPE HDO6104-MS
- FLUKE Ti400 THERMAL IMAGING CAMERA
- PRINTED WIRING PROTOTYPING AND DEVELOPMENT LINE
- ORIEL INSTRUMENT’S IQE-200 SYSTEM
- CHARACTERIZATION SYSTEM FOR PHOTOVOLTAIC MODULES AND CELLS / SOLAR SIMULATOR ORIEL SOL3A CLASS AAA
- HEAT TREATMENT OVEN
- PORTABLE 3D SCANNER – EXASCAN
- MULTIAXIAL DYNAMIC TESTING SYSTEM FOR MECHANICAL PARTS MTS BIONIX
- FORM 1 STEREOLITHOGRAPHY (SLA) TYPE Rapid prototyping equipment
- LASER ABLATION SYSTEM
- CTX 310 ECOLINE LATHE
- ULTRASONIC 30 LINEAR 5-AXIS MACHINING CENTER
- MULTIPARAMETER – MULTI 9430
- DIGESTOR BERGHOF MWS2
- FAT EXTRACTOR N 6 – Selecta
- MODULAR REACTOR
- PREMIUM VISCOMETER – Fungilab
- DIGESTOR TOP WAVE
- PetroOxy OXIDATION STABILITY TESTER – Anton Paar
- QUARTZ CRYSTAL MICRO BALANCE
- APARAT DE ANALIZĂ ELEMENTALĂ PENTRU DETERMINARE MERCURULUI: MERCUR DUO – Analytik Jena
- CALORIMETRU – PARR 6400 Parr Instrument Company
- APARAT DE ANALIZĂ ELEMENTALĂ PENTRU DETERMINARE: C, S, Cl – Multi EA 4000 – Analytik Jena
- TERMOBALANȚA METTLER TOLEDO HS153
- TITRATOR KARL FISCHER COULOMETRIC
- SPECTROMETRU GAMMA PORTABIL
- SPECTROMETRU DE ABSORBŢIE ATOMICĂ (AAS)
- SPECTROMETRU CU REZONANȚĂ MAGNETICĂ NUCLEARĂ (RMN)
- SPECTROMETRU RAMAN PORTABIL CU DOUĂ LUNGIMI DE UNDĂ ÎN IR XANTUS-2 – Rigaku
- SPECTROFOTOMETRU DUBLU-FASCICUL UV-VIS EVOLUTION 260 BIO – Thermo Scientific
- SPECTROFOTOMETRU MONOFASCICUL UV-VIS SPEKOL 1300 – Analytik Jena
- SPECTROMETRU IR CU TRANSFORMATĂ FOURIER (FT-IR) CUPLAT CU MICROSCOP IR DE ÎNALTĂ REZOLUȚIE
- SPECTROMETRU DE MASĂ CU PLASMĂ CUPLATĂ INDUCTIV (ICP-MS)
- SPECTROMETRU DE FLUORESCENȚĂ DE RAZE X CU DISPERSIE DUPĂ LUNGIMEA DE UNDA (WDXRF)
- DIFRACTOMETRU DE RAZE X (XRD)
- PLANAR PLASMA CORROSION INSTALLATION WITH REACTIVE IONS (RIE)
- VACUUM DEPOSITIONS OF METAL AND DIELECTRIC LAYERS BY SPUTTERING
- PRIMO STAR MICROSCOPE
- MOTORIZED DIRECT RESEARCH MICROSCOPE FOR EXAMINATION IN TRANSMITTED LIGHT IN BRIGHTFIELD, PHASE CONTRAST IN INCIDENT LIGHT AND BRIGHTFIELD OR DARKFIELD WITH FLUORESCENCE AXIO IMAGER M2M
- ATOMIC FORCE MICROSCOPE (AFM) (Ntegra Prima by NT-MDT)
- NANO INDENTER AGILENT G200
- SU-70 Scanning Electron Microscope (SEM) coupled with energy dispersive spectrometer (EDS), wavelength dispersive spectrometer (WDS) and electron beam lithography (EBL) system
- 2026 – 1998
- 2026
- 2026-2002
- 2025
- 2024
- 2002-2023
- Theology
- Chemistry
- Physics
- Engineering
- Materials science
- Environmental science
- Computer science
- Mathematics
- Economy
- Justice
- Political science
- Geography
- History
- Language and literature
- Philosophy
- Sport