The service for the characterisation of micro- and nanomaterials by atomic force microscopy (AFM) offers advanced surface and structural analyses at the micro and nanometric scale, allowing detailed morphological, topographical and functional investigations of the materials used in high-performance technological applications. Using AFM techniques, high-resolution 2D and 3D images of material surfaces can be obtained, making it possible to visualise particle shape, assess surface roughness and analyse in detail the structural characteristics of the materials investigated.
The service includes the characterisation of nanometric layer deposits produced by techniques such as sputtering, electron beam evaporation and other thin film deposition methods frequently used in microelectronics and materials engineering. The analyses allow roughness parameters to be determined, the uniformity of coating layers to be assessed and surface morphology to be investigated, all of which are essential aspects for optimising the functional performance of the deposited materials and of the manufactured components.
In addition, the service incorporates AFM defectoscopy applications for identifying surface defects, microcracks, inhomogeneities and other structural imperfections that may influence the mechanical, electrical or functional behaviour of materials. These investigations support quality control activities, the development of advanced materials and the validation and optimisation of technological processes.
The potential beneficiaries of this service include companies and public institutions active in fields such as nanotechnology, metallurgy and the iron and steel industry, semiconductor production and photovoltaic systems. Owing to the high precision and resolution of AFM analyses, the service can support research and development activities, technology transfer processes, the optimisation of processes and the assessment of the performance of materials intended for industrial and scientific applications.
Delivering the service requires specialised equipment and materials, including an atomic force microscope (AFM), dedicated AFM probes for different measurement modes, isopropyl alcohol for cleaning the samples, mica discs used as substrates, double-sided adhesive tape for fixing the samples, as well as other auxiliary equipment and materials needed for the proper preparation and handling of samples under controlled conditions.