The service "Comprehensive characterisation of micro- and nanomaterials by SEM-EDS/WDS", provided by ICSTM, offers advanced analytical capabilities for the investigation of materials at the micro and nanometric scale, supporting both scientific research activities and industrial applications. By combining high-resolution scanning electron microscopy with energy dispersive and wavelength dispersive X-ray spectroscopy techniques, the service allows the complex structural, morphological and elemental characterisation of a wide range of materials and surfaces.
The service makes it possible to carry out detailed morphological analyses of micro- and nanomaterials, including the visualisation of particle geometry, porosity, surface roughness, coating layers and fibre organisation. Through SEM imaging, complex surface architectures and microstructural characteristics can be examined with high precision, providing valuable information on material quality, degradation processes and the performance of manufacturing processes.
The integrated EDS/WDS microanalysis provides qualitative and quantitative elemental characterisation at selected points, along defined lines or over mapped areas. These investigations are particularly useful for identifying contaminants, verifying the purity of alloys, assessing the composition of geological samples and analysing the distribution of elements in complex materials. The system also allows advanced elemental mapping and the correlation between morphology and chemical composition.
The service also includes fractographic investigations used to identify fracture mechanisms and the causes of failure in metallic, ceramic or composite materials. Through the analysis of fracture surfaces, it is possible to distinguish between brittle fracture, ductile fracture, fatigue-induced degradation and corrosion-related deterioration, contributing to defect analysis in fields such as metallurgy, automotive engineering, aeronautics and advanced manufacturing.
High-precision dimensional measurements can also be performed, including the determination of coating thickness, particle sizing, the assessment of nanostructures and the measurement of the distances between microelectronic components or integrated circuits. These analyses are essential for quality control, process optimisation and the validation of advanced materials and devices.
The SEM-EDS/WDS characterisation platform meets the needs of companies, research organisations and public institutions active in fields such as nanotechnology, semiconductors, metallurgy, photovoltaics, environmental sciences, biology, agriculture, the food industry, cosmetics, archaeometry and the chemical and petroleum industries. The analytical workflow is supported by dedicated infrastructure and by sample preparation facilities, including vacuum systems, cooling units, laboratory ovens, polishing equipment, sample holders and the auxiliary materials required for precise and reproducible investigations.